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ISI SEM SS40 fitted with Edax

MANUFACTURER ISI (manufacturer's website)
CONTACT 1 External enquiries: Martine Townsend - Grants & Funding Unit
CONTACT 2 Internal enquiries: Dr Nathalie Renevier
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SITE Media Factory Site


The equipment has been recently refurbished and fitted with Energy Dispersive Analysis technique. Energy – dispersive X-ray spectroscopy (EDS, EDX, or XEDS) is an analytical technique used for the elemental analysis of chemical characterization of a sample.

Applications include materials and product research, troubleshooting, deformulation, and more. EDX systems are attachments to SEM and TEM instruments where the imaging capability of the microscope identifies the specimen of interest.

The data generated by EDX analysis consist of spectra showing peaks corresponding to the elements making up the true composition of the sample being analysed. It is possible to produce a surface map and assess the overall composition of a sample.

Accuracy of EDS spectrum can be affected by various factors. Many elements will have overlapping peaks (e.g., Ti Kβ and V Kα, Mn Kβ and Fe Kα).

The accuracy of the spectrum can also be affected by the nature of the sample. X-rays can be generated by any atom in the sample that is sufficiently excited by the incoming beam.

These X-rays are emitted in any direction, and so they may not all escape the sample. The likelihood of an X-ray escaping the specimen, and thus being available to detect and measure, depends on the energy of the X-ray and the amount and density of material it has to pass through. This can result in reduced accuracy in inhomogeneous and rough samples.

Item ID #103.

Last Updated: 9th August, 2017