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|MANUFACTURER||DME (manufacturer's website)|
|MODEL||AFM Dualscope 200|
|CONTACT 1||External enquiries: Martine Townsend - Grants & Funding Unit|
|CONTACT 2||Internal enquiries: Dr Nathalie Renevier|
|Enquire about this item|
|SITE||Media Factory Site|
The DME – Ratescope / Dualscope 200 is able to produce high resolution imaging of surfaces. From atomic resolution to 200 x 200 micron areas.
Topograohy imaging using Contact Mode, Tapping Mode and SPM Mode, Surface roughness analysis.
Force – distance analysis for local compliance, Lateral Force Microscopy (LFM) Electrical (IV) mapping.
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Last Updated: 9th August, 2017